The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2008

Filed:

Sep. 30, 2005
Applicants:

Robert Kamil Bryll, Bothell, WA (US);

Vidya Venkatachalam, Bellevue, WA (US);

Inventors:

Robert Kamil Bryll, Bothell, WA (US);

Vidya Venkatachalam, Bellevue, WA (US);

Assignee:

Mitutoyo Corporation, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Improved user interface methods facilitate navigation and programming operations for a magnified machine vision inspection system. Large composite images are determined and stored. The composite images include workpiece features that are distributed beyond the limits of a single magnified field of view of the machine vision system. Despite their size, the composite images may be recalled and displayed in a user-friendly manner that approximates a smooth, real-time, zoom effect. The user interface may include controls that allow a user to easily define a set of workpiece features to be inspected using a composite image, and to easily position the machine vision system to view those workpiece features for the purpose of programming inspection operations for them.


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