The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2008
Filed:
Sep. 08, 2004
Yoshiharu Umemura, Tokyo, JP;
Toshiyuki Okayasu, Tokyo, JP;
Toshiaki Awaji, Tokyo, JP;
Masahiro Yamakawa, Tokyo, JP;
Yoshiharu Umemura, Tokyo, JP;
Toshiyuki Okayasu, Tokyo, JP;
Toshiaki Awaji, Tokyo, JP;
Masahiro Yamakawa, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
There is provided a testing apparatus for testing a device under test, wherein the testing apparatus is provided with a timing generator for generating a timing signal indicating the timing at which a test signal is applied; a plurality of timing delay units for delaying the timing signal; a plurality of drivers for applying the delayed test signals; a sampler for sampling the test signal and outputting a sample voltage; a comparator for outputting a comparison result indicating whether the sample voltage is higher than the reference voltage; a determination part for determining whether the sample voltage matches the reference voltage; and a timing calibration part for calibrating the delay time caused in the timing signal by the plurality of timing delay units in order to synchronize the timing at which the test signals are applied to the device under test.