The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2008
Filed:
Jun. 22, 2004
Applicants:
Zhuoyu Bao, Austin, TX (US);
David M. Wu, Austin, TX (US);
Chih-jen M. Lin, Austin, TX (US);
Inventors:
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A technique for testing a memory array. More particularly, embodiments of the invention relate to a memory array testing architecture in which a memory array within a device under test (DUT) is able to be tested at speeds substantially similar to those under typical operating conditions of the memory array without incurring significant die real estate and power penalties.