The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Jan. 17, 2006
Norbert Rehm, Apex, NC (US);
Rath Ung, Apex, NC (US);
Rob Perry, Cary, NC (US);
Jan Zieleman, Cary, NC (US);
Dirk Fuhrmann, Apex, NC (US);
Norbert Rehm, Apex, NC (US);
Rath Ung, Apex, NC (US);
Rob Perry, Cary, NC (US);
Jan Zieleman, Cary, NC (US);
Dirk Fuhrmann, Apex, NC (US);
Infineon Technologies AG, Munich, DE;
Abstract
Embodiments of the invention generally provide methods and systems for increasing the level of parallelism in testing memory devices. A set of test signals provided by a memory tester may be shared by two or more devices under test. A chip selector may be used to select at least one or all the devices sharing a given set of test signals. By sharing test signals between multiple devices, the level of parallel testing may be increased without increasing the pin count and complexity of memory testers and probe cards.