The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2008

Filed:

Aug. 03, 2005
Applicant:

Shu-jen Sung, Yilan, TW;

Inventor:

Shu-Jen Sung, Yilan, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of fabricating interconnect is described. A first dielectric layer having an opening is formed over a substrate. A metal layer is filled into the opening. A material layer is formed over the first dielectric layer and the metal layer. A surface treatment process is performed to the material layer so as to form a cap layer on the surface of the metal layer. The material layer and a portion of the first dielectric layer are removed. A second dielectric layer is formed over the substrate, and the surface of the second dielectric layer is higher than that of the cap layer. A planarization process is performed at least to remove a portion of the second dielectric layer and a portion of the cap layer so as to expose the top of the opening.


Find Patent Forward Citations

Sung, Shu-Jen. (2008). Method of fabricating interconnect (U.S. Patent No. 7348272). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7348272

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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