The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2008
Filed:
Feb. 17, 2006
Alan S. Krech, Jr., Ft. Collins, CO (US);
Stephen D. Jordan, Ft. Collins, CO (US);
John M. Freeseman, Ft Collins, CO (US);
Alan S. Krech, Jr., Ft. Collins, CO (US);
Stephen D. Jordan, Ft. Collins, CO (US);
John M. Freeseman, Ft Collins, CO (US);
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A method and apparatus for filtering failures due to must-repair rows or columns from a memory test fail summary image includes current available redundant row failure counts respectively associated with rows of a memory device and current available redundant column failure counts associated with columns of the device. Respective failure counts are preloaded with the respective values of redundant rows and columns available for repairing the device. When failures in memory cells of the device are encountered, either during test, or during scan of an earlier generated error image, the row and column failure counts associated with the rows and columns containing the memory cell failures are decremented. At the end of a test, the value of the failure counts indicates whether the corresponding row or column contain any failures at all, whether the corresponding row or column is designated as a 'must-repair' row or column, and otherwise how many errors the corresponding row or column contain.