The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2008

Filed:

May. 21, 2004
Applicants:

Kazuhiro Fujikawa, Osaka, JP;

Shin Harada, Osaka, JP;

Hiroyuki Matsunami, Yawata, JP;

Tsunenobu Kimoto, Kyoto, JP;

Inventors:

Kazuhiro Fujikawa, Osaka, JP;

Shin Harada, Osaka, JP;

Hiroyuki Matsunami, Yawata, JP;

Tsunenobu Kimoto, Kyoto, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/80 (2006.01);
U.S. Cl.
CPC ...
Abstract

On an SiC single crystal substrate, an electric field relaxation layer and a p− type buffer layer are formed. The electric field relaxation layer is formed between the p− type buffer layer and the SiC single crystal substrate to contact SiC single crystal substrate. On the p− type buffer layer, an n type semiconductor layer is formed. On the n type semiconductor layer, a p type semiconductor layer is formed. In the p type semiconductor layer, an n+ type source region layer and an n+ type drain region layer are formed separated by a prescribed distance from each other. At a part of the region of p type semiconductor layer between the n+ type source region layer and the n+ type drain region layer, a p+ type gate region layer is formed.


Find Patent Forward Citations

Fujikawa, Kazuhiro. (2008). Field effect transistor (U.S. Patent No. 7321142). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7321142

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