The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2008
Filed:
Jan. 11, 2006
Atsushi Ono, Tokyo, JP;
Toshiyuki Okayasu, Tokyo, JP;
Akihiro Fujimoto, Tokyo, JP;
Masashi Shibata, Tokyo, JP;
Atsushi Ono, Tokyo, JP;
Toshiyuki Okayasu, Tokyo, JP;
Akihiro Fujimoto, Tokyo, JP;
Masashi Shibata, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
The present invention provides a test apparatus which comprises: a test head which applies a test pattern to the electronic device; a main frame which includes multiple frame-side connectors and which supplies control signals to the test head via the frame-side connectors; and a cable unit which provides optical connection between the frame-side connectors and the test head, and which transmits the control signals to the test head. With such an arrangement, the cable unit comprises: multiple optical fiber cables which transmit the control signals; multiple unit-side connectors which are provided at the ends of the optical fiber cables, and which are provided corresponding to the multiple frame-side connectors; a unit fixing portion which fixes the cable unit to the main frame; and a connector holder which holds the unit-side connectors in a manner which enables each unit-side connector to be inserted/extracted into/from the frame-side connector independent of each other.