The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7307023 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 11, 2007

Filed:

Oct. 02, 2006
Applicants:

Dai Fukushima, Kamakura, JP;

Gaku Minamihaba, Yokohama, JP;

Hiroyuki Yano, Yokohama, JP;

Susumu Yamamoto, Oita, JP;

Inventors:

Dai Fukushima, Kamakura, JP;

Gaku Minamihaba, Yokohama, JP;

Hiroyuki Yano, Yokohama, JP;

Susumu Yamamoto, Oita, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for polishing a Cu film comprises contacting a Cu film formed above a semiconductor substrate with a polishing pad attached to a turntable, and supplying a first chemical liquid which promotes the polishing of the Cu film and a second chemical liquid which contains a surfactant, to the polishing pad while the turntable being rotated, thereby polishing the Cu film, while monitoring at least one of a table current of the turntable and a surface temperature of the polishing pad to detect a change in at least one of the table current of the turntable and the surface temperature of the polishing pad. The supply of the second chemical liquid is controlled in conformity with the change.


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Fukushima, Dai. (2007). Polishing method of cu film and method for manufacturing semiconductor device (U.S. Patent No. 7307023). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7307023

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