The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2007
Filed:
Aug. 25, 2005
Janusz Rajski, West Linn, OR (US);
Grzegorz Mrugalski, Wilsonville, OR (US);
Artur Pogiel, 89-200 Szubin, PL;
Jerzy Tyszer, 61-249 Poznam, PL;
Chen Wang, Tigard, OR (US);
Janusz Rajski, West Linn, OR (US);
Grzegorz Mrugalski, Wilsonville, OR (US);
Artur Pogiel, 89-200 Szubin, PL;
Jerzy Tyszer, 61-249 Poznam, PL;
Chen Wang, Tigard, OR (US);
Other;
Abstract
Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, one or more signatures are received that indicate the presence of one or more errors in one or more corresponding compressed test responses. Scan cells in the circuit-under-test that caused the errors are identified by analyzing the signatures. In this exemplary embodiment, the analysis includes selecting a scan cell candidate that potentially caused an error in a compressed test response based at least partially on a weight value associated with the scan cell candidate, the weight value being indicative of the likelihood that the scan cell candidate caused the error. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Tangible computer-readable media comprising lists of failing scan cells identified by any of the disclosed methods are also provided.