The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2007

Filed:

Oct. 20, 2003
Applicants:

Kuo-chi Tu, Hsin-Chu, TW;

Chun-yao Chen, Hsin-Chu, TW;

Shou-gwo Wuu, Hsin-Chu, TW;

Chen-jong Wang, Hsin-Chu, TW;

Inventors:

Kuo-Chi Tu, Hsin-Chu, TW;

Chun-Yao Chen, Hsin-Chu, TW;

Shou-Gwo Wuu, Hsin-Chu, TW;

Chen-Jong Wang, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/105 (2006.01);
U.S. Cl.
CPC ...
Abstract

A metal-insulator-metal (MIM) capacitor structure and method of manufacturing thereof. A plurality of MIM capacitor patterns is formed in two or more insulating layers. The insulating layers may comprise a via layer and a metallization layer of a semiconductor device. A top portion of the top insulating layer is recessed in a region between at least two adjacent MIM capacitor patterns. When the top plate material of the MIM capacitors is deposited, the top plate material fills the recessed area of the top insulating layer between the adjacent MIM capacitor pattern, forming a connecting region that couples together the top plates of the adjacent MIM capacitors. A portion of the MIM capacitor bottom electrode may be formed in a first metallization layer of the semiconductor device.


Find Patent Forward Citations

Loading…