The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
Mar. 07, 2006
Neil J. Goldfine, Newton, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Yanko K Sheiretov, Waltham, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
David C. Grundy, Reading, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Neil J. Goldfine, Newton, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Yanko K Sheiretov, Waltham, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
David C. Grundy, Reading, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
JENTEK Sensors, Inc., Waltham, MA (US);
Abstract
The condition of insulating and semiconducting dielectric materials is assessed by a sensor array that uses electric fields to interrogate the test material. The sensor has a linear array of parallel drive conductors interconnected to form a single drive electrode and sense conductors placed on each side of and parallel to a drive conductor. Subsets of the sense conductors are interconnected to form at least two sense elements sensitive to different material regions. The sense conductors may be at different distances to the drive conductors, enabling measurement sensitivity to different depths into the test material. The material condition is assessed directly from the sense element responses or after conversion to an effective material property, such as an electrical conductivity or dielectric permittivity.