The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2007

Filed:

May. 29, 2002
Applicants:

Ho-yuan Yu, Saratoga, CA (US);

Valentino L. Liva, Los Altos, CA (US);

Inventors:

Ho-Yuan Yu, Saratoga, CA (US);

Valentino L. Liva, Los Altos, CA (US);

Assignee:

Qspeed Semiconductor Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/80 (2006.01); H01L 31/112 (2006.01); H01L 29/74 (2006.01);
U.S. Cl.
CPC ...
Abstract

A junction field effect transistor (JFET) with a reduced gate capacitance. A gate definition spacer is formed on the wall of an etched trench to establish the lateral extent of an implanted gate region for a JFET. After implant, the gate is annealed. In addition to controlling the final junction geometry and thereby reducing the junction capacitance by establishing the lateral extent of the implanted gate region, the gate definition spacer also limits the available diffusion paths for the implanted dopant species during anneal. Also, the gate definition spacer defines the walls of a second etched trench that is used to remove a portion of the p-n junction, thereby further reducing the junction capacitance.


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