The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
May. 17, 2002
Claude R. Gauthier, Fremont, CA (US);
Brian Amick, Austin, TX (US);
Dean Liu, Sunnyvale, CA (US);
Pradeep Trivedi, Sunnyvale, CA (US);
Claude R. Gauthier, Fremont, CA (US);
Brian Amick, Austin, TX (US);
Dean Liu, Sunnyvale, CA (US);
Pradeep Trivedi, Sunnyvale, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A calibration and adjustment system for post-fabrication control of a delay locked loop bias-generator is provided. The calibration and adjustment system includes an adjustment circuit operatively connected to the bias-generator, where the adjustment circuit is controllable to facilitate a modification of a voltage output by the bias-generator. Such control of the voltage output by the bias-generator allows a designer to achieve a desired delay locked loop performance characteristic after the delay locked loop has been fabricated. A representative value of the amount of adjustment desired in the bias-generator output may be stored and subsequently read to adjust the delay locked loop.