The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2007

Filed:

May. 07, 2004
Applicant:

Ahmed Rashid Syed, Santa Clara, CA (US);

Inventor:

Ahmed Rashid Syed, Santa Clara, CA (US);

Assignee:

Credence Systems Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to test systems for testing integrated circuit devices and to calibration associated systems and methods. One embodiment of the invention provides an auto-calibration system. The system includes: a plurality of delay line elements (DLEs) adapted to be connected in a loop; a state machine coupled to the plurality of DLEs and operative to provide state data for the plurality of DLEs; a start oscillation signal receiving circuit coupled to the loop and operative to trigger the loop in response to receipt of a start oscillation signal; and a calibration circuit coupled to the loop and operative to acquire calibration data for the plurality of DLEs.


Find Patent Forward Citations

Syed, Ahmed. (2007). Calibration-associated systems and methods (U.S. Patent No. 7242257). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7242257

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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