The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2007

Filed:

Jun. 14, 2005
Applicants:

Yi-hsun Wu, Hsin-Chu, TW;

Kuan-lun Chang, Hsinchu County, TW;

Chuan-ying Lee, Hsin-Chu, TW;

Jian-hsing Lee, Hsin-chu, TW;

Inventors:

Yi-Hsun Wu, Hsin-Chu, TW;

Kuan-Lun Chang, Hsinchu County, TW;

Chuan-Ying Lee, Hsin-Chu, TW;

Jian-Hsing Lee, Hsin-chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/72 (2006.01); H01L 29/74 (2006.01); H01L 31/111 (2006.01); H01L 23/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor layout structure for an electrostatic discharge (ESD) protection circuit is disclosed. The semiconductor layout structure includes a first area, in which one or more devices are constructed for functioning as a silicon controlled rectifier, and a second area, in which at least one device is constructed for functioning as a trigger source that provides a triggering current to trigger the silicon controlled rectifier for dissipating ESD charges during an ESD event. The first area and the second area are placed adjacent to one another without having a resistance area physically interposed or electrically connected therebetween, such that the triggering current received by the silicon controlled rectifier is increased during the ESD event.


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