The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2007

Filed:

Apr. 29, 2005
Applicants:

James Orrock, Eden Prairie, MN (US);

Thomas Larson, San Mateo, CA (US);

Bruno Schueler, San Jose, CA (US);

Lawrence Bot, Maple Grove, MN (US);

James Quigley, Mountain View, CA (US);

Emir Gurer, Scotts Valley, CA (US);

Inventors:

James Orrock, Eden Prairie, MN (US);

Thomas Larson, San Mateo, CA (US);

Bruno Schueler, San Jose, CA (US);

Lawrence Bot, Maple Grove, MN (US);

James Quigley, Mountain View, CA (US);

Emir Gurer, Scotts Valley, CA (US);

Assignee:

ReVera Incorporated, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment of the invention, a method for analyzing data from an instrument is disclosed. The raw data generated by the instrument, along with configuration data generated by a user, is packaged into a calling model. The raw data may include, for example, counts having a certain kinetic energy when analyzing photoelectron spectroscopy data. The configuration data may include several parameters selected by the user based on the composition and configuration of the structure being measured. The calling model may serve as an interface between the instrument and an engine for generating an algorithm for returning desired results to the user. The engine then generates the algorithm as well as the results specified by the user, and the calling model returns the results to the user. This allows a specific algorithm and results for a specific measured sample or structure to be generated using known algorithms and functions.


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