The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Jan. 30, 2006
Applicants:
J. Albert Schultz, Houston, TX (US);
Valeri Raznikov, Moscow, RU;
Thomas F. Egan, Houston, TX (US);
Michael V. Ugarov, Houston, TX (US);
Agnès Tempez, Houston, TX (US);
Inventors:
J. Albert Schultz, Houston, TX (US);
Valeri Raznikov, Moscow, RU;
Thomas F. Egan, Houston, TX (US);
Michael V. Ugarov, Houston, TX (US);
Agnès Tempez, Houston, TX (US);
Assignee:
Ionwerks, Inc., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract
Improved ion focusing for an ion mobility drift cell allows for improved throughput for subsequent detection such as mass detection. Improved focusing is realized by the use of alternating regions of high and low electric fields in the ion mobility drift cell.