The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2007
Filed:
Jun. 22, 2005
Bendik Kleveland, Santa Clara, CA (US);
Tae Hee Lee, Saratoga, CA (US);
Seung Geon Yu, San Ramon, CA (US);
Chia Yang, San Jose, CA (US);
Feng LI, San Jose, CA (US);
Xiaoyu Yang, Campbell, CA (US);
Bendik Kleveland, Santa Clara, CA (US);
Tae Hee Lee, Saratoga, CA (US);
Seung Geon Yu, San Ramon, CA (US);
Chia Yang, San Jose, CA (US);
Feng Li, San Jose, CA (US);
Xiaoyu Yang, Campbell, CA (US);
SanDisk 3D LLC, Sunnyvale, CA (US);
Abstract
A method and apparatus for programming a memory array are disclosed. In one embodiment, after each word line is programmed, an attempt is made to detect a defect on that word line. If a defect is detected, the word line is repaired with a redundant word line. The word lines are then reprogrammed and rechecked for defects. In another embodiment, after each word line is programmed, an attempt is made to detect a defect on that word line. If a defect is detected, that word line is repaired along with a previously-programmed adjacent word line. In yet another embodiment, after each word line is programmed, an attempt is made to detect a defect on that word line and a previously-programmed adjacent word line. If a defect is detected on that word line, that word line and the previously-programmed adjacent word line are repaired with redundant word lines.