The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7210864 B1

PDF
Full Text
Expired
Date of Patent:
May. 01, 2007

Filed:

Jan. 04, 2005
Applicants:

Makio Higashi, Tokyo, JP;

Akira Miyata, Tokyo, JP;

Inventors:

Makio Higashi, Tokyo, JP;

Akira Miyata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03D 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A wafer flow recipe is prepared. Based on this wafer flow recipe, there are estimated and calculated respectively a PCD time from a time point at which a process for coating a resist liquid on a substrate by a coating unit has been terminated to a time point at which a first heating process is started at a first heating unit, a PAD time from a time point at which the first heating process has been terminated at the first heating unit to a time point at which an exposure process is started, and a PED time from a time point at which the exposure has been terminated to a time point at which a second heating process is started at a second heating unit. Then, these estimated times are displayed.


Find Patent Forward Citations

Higashi, Makio. (2007). Coating and developing apparatus (U.S. Patent No. 7210864). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7210864

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