The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2007
Filed:
May. 07, 2004
Applicant:
Ahmed Rashid Syed, Santa Clara, CA (US);
Inventor:
Ahmed Rashid Syed, Santa Clara, CA (US);
Assignee:
Credence Systems Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/333 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to test systems for testing integrated circuit devices and to calibration associated systems and methods. One embodiment of the invention provides a method for providing formatted levels for use in a test system. The method includes: providing on a single CMOS IC, a timing generation circuit operative to provide timing information signals; and a formatter in communication with the timing generation circuit.
Syed, Ahmed. (2007). Test systems and methods with compensation techniques (U.S. Patent No. 7203875). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7203875
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile