The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2007
Filed:
May. 12, 2003
Fadi Maamari, San Jose, CA (US);
Sonny Ngai San Shum, San Jose, CA (US);
Benoit Nadeau-dostie, Aylmer, CA;
Fadi Maamari, San Jose, CA (US);
Sonny Ngai San Shum, San Jose, CA (US);
Benoit Nadeau-Dostie, Aylmer, CA;
LogicVision, Inc., San Jose, CA (US);
Abstract
A method of fault diagnosis of integrated circuits having failing test vectors with observed fault effects using fault candidate fault-effects obtained by simulation of a set of test vectors, comprises determining a fault candidate diagnostic measure for each fault candidate, the fault candidate diagnostic measure having a fault candidate match metric, an observed fault effect mismatch metric and a fault candidate excitation metric, ranking fault candidates in decreasing diagnostic measure order; and identifying fault candidate(s) having the highest diagnostic measure as the most likely cause of observed fault effects.