The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2007
Filed:
Aug. 28, 2003
Neil J. Goldfine, Newton, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Vladimir Tsukernik, West Roxbury, MA (US);
Ian C. Shay, Cambridge, MA (US);
David C. Grundy, Reading, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Neil J. Goldfine, Newton, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Vladimir Tsukernik, West Roxbury, MA (US);
Ian C. Shay, Cambridge, MA (US);
David C. Grundy, Reading, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
JENTEK Sensors, Inc., Waltham, MA (US);
Abstract
Described are methods for pressurizing elastic support structures or balloons in sensor probes used for the inspection of components having areas of limited access. When inflated, the balloons press flexible sensors against the surface of the material under test. When deflated, the balloons permit easier insertion of the probes into the component and reduce the mechanical stresses on the sensors, thereby extending the sensor lifetime. By sequentially partially inserting the sensor into a limited access area from either side of the limited access area and scanning in opposite directions, the entire surface of the test material can be inspected.