The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2007

Filed:

Oct. 30, 2003
Applicants:

Chih-chen Cho, Boise, ID (US);

Zhongze Wang, Boise, ID (US);

Inventors:

Chih-Chen Cho, Boise, ID (US);

Zhongze Wang, Boise, ID (US);

Assignee:

Micron Technology, inc., Boise, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/8238 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for making a semiconductor structure are discussed. The methods include forming openings in a high-density area and a high-speed area, and forming a metallization layer simultaneously into the high-density area and the high-speed area. The metallization layer includes a combination of substances and compounds that reduce vertical resistance, reduce horizontal resistance, and inhibit cross-diffusion.


Find Patent Forward Citations

Quick Actions:

Cho, Chih-Chen. (2007). Methods for making semiconductor structures having high-speed areas and high-density areas (U.S. Patent No. 7169662). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7169662

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…