The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Sep. 03, 2004
Neil J. Goldfine, Newton, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
David C. Grundy, Reading, MA (US);
Ian C. Shay, Waltham, MA (US);
Robert J. Lyons, Boston, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Neil J. Goldfine, Newton, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
David C. Grundy, Reading, MA (US);
Ian C. Shay, Waltham, MA (US);
Robert J. Lyons, Boston, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Jentek Sensors, Inc., Waltham, MA (US);
Abstract
Quasistatic sensor responses may be converted into multiple model parameters to characterize hidden properties of a material. Methods of conversion use databases of responses and, in some cases, databases that include derivatives of the responses, to estimate at least three unknown model parameters, such as the electrical conductivity, magnetic permeability, dielectric permittivity, thermal conductivity, and/or layer thickness. These parameter responses are then used to obtain a quantitative estimate of a property of a hidden feature, such as corrosion loss layer thicknesses, inclusion size and depth, or stress variation. The sensors can be single element sensors or sensor arrays and impose an interrogation electric, magnetic, or thermal field.