The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2006

Filed:

Dec. 30, 2004
Applicants:

Kedar Mangrulkar, Folsom, CA (US);

Sanjeev Jahagirdar, Folsom, CA (US);

Varghese George, Folsom, CA (US);

Venkatesh Prasanna, Folsom, CA (US);

Inder Sodhi, Folsom, CA (US);

Inventors:

Kedar Mangrulkar, Folsom, CA (US);

Sanjeev Jahagirdar, Folsom, CA (US);

Varghese George, Folsom, CA (US);

Venkatesh Prasanna, Folsom, CA (US);

Inder Sodhi, Folsom, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 1/00 (2006.01); G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device and method for continually monitoring multiple thermal sensors located at hotspots across a processor. The sensors are connected to a sensor cycling and selection block located at a periphery of the die. The output from the sensor selection block is converted into a digital temperature code. Based on the digital temperature code, thermal events trigger various thermal controls. The thermal event triggers may be software-programmable, providing flexible temperature management.


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