The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7139998 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 21, 2006

Filed:

Sep. 30, 2003
Applicants:

Kazuya Fukuhara, Tokyo, JP;

Tatsuhiko Higashiki, Fujisawa, JP;

Soichi Inoue, Yokohama, JP;

Inventors:

Kazuya Fukuhara, Tokyo, JP;

Tatsuhiko Higashiki, Fujisawa, JP;

Soichi Inoue, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A photomask designing method used in a lithography process, the lithography process comprises illuminating light on a photomask and converging the light which has passed through the photomask on a photosensitive substrate via a projection optical system, the photomask designing method comprises acquiring a transmittance characteristic of the projection optical system, the characteristic varing depending on a difference in optical paths of light in the projection optical system, the light passing through the projection optical system, and acquiring mask bias of the photomask by use of the transmittance characteristic of the projection optical system.


Find Patent Forward Citations

Fukuhara, Kazuya. (2006). Photomask designing method, pattern predicting method and computer program product (U.S. Patent No. 7139998). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7139998

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