The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2006
Filed:
Feb. 24, 2005
Applicants:
Klaus Lischka, Paderborn, DE;
Alexander Kharchenko, Almelo, NL;
Inventors:
Klaus Lischka, Paderborn, DE;
Alexander Kharchenko, Almelo, NL;
Assignee:
PANalytical B.V., Almelo, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A monochromatoris used to direct X-rays from X-ray sourceonto a sampleas a convergent beam. The sampleis in a growth chamber. The sample is rotated, and diffraction measurements are made in parallel with multichannel detector. A specific reflection is used so that the intensity against angle graph measured in the multichannel detector gives information about the vertical lattice parameter. To compensate for wobble inevitably introduced by the rotation of the sample, short time measurements are made and summed.