The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2006

Filed:

Feb. 11, 2005
Applicants:

Joaquin Hinojosa, Round Rock, TX (US);

Eric Jason Fluhr, Round Rock, TX (US);

Michael Ju Hyeok Lee, Austin, TX (US);

Jose Angel Paredes, Austin, TX (US);

Ed Seewann, Austin, TX (US);

Inventors:

Joaquin Hinojosa, Round Rock, TX (US);

Eric Jason Fluhr, Round Rock, TX (US);

Michael Ju Hyeok Lee, Austin, TX (US);

Jose Angel Paredes, Austin, TX (US);

Ed Seewann, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A CAM system is disclosed in which requests for address translation are provided as input search data to a dynamic compare bitline generator. The dynamic compare bitline generator also receives a compare mask and applies the compare mask to associated input search data bits on a per bit basis. The mask contains information that specifies a selected page size and a selected logic mode that can be applied to a compare array in which the specified search is conducted. The compare array is coupled to a data array to which the compare array indicates a result of the search.


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