The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2006
Filed:
Nov. 17, 2000
Kenji Obara, Ebina, JP;
Yuji Takagi, Kamakura, JP;
Ryo Nakagaki, Kawasaki, JP;
Yasuhiro Ozawa, Abiko, JP;
Toshiei Kurosaki, Hitachinaka, JP;
Seiji Isogai, Hitachinaka, JP;
Kenji Obara, Ebina, JP;
Yuji Takagi, Kamakura, JP;
Ryo Nakagaki, Kawasaki, JP;
Yasuhiro Ozawa, Abiko, JP;
Toshiei Kurosaki, Hitachinaka, JP;
Seiji Isogai, Hitachinaka, JP;
Hitachi, Tokyo, JP;
Abstract
According to the present invention, techniques including a method and apparatus for classifying and displaying images are provided. In an embodiment of the present invention a defect image classification method using inspected objects is provided. The method includes defect images obtained from at least one inspected object. Next a set of defect images is classified into a specified category, which has a feature. The defect images are arranged for display according to the feature and then displayed. The arranging of the defect images may also be based on an evaluation value for each defect image. Another embodiment provides a defect image classification method using inspected objects. Defect images are obtained from at least one inspected object. Next the defect images are classified into a plurality of categories and at least two information items for example, a defect distribution diagram showing locations of defects in the inspected object, information associated with a category of the plurality of categories, and a defect size distribution, are displayed.