The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2006

Filed:

May. 17, 2002
Applicants:

Claude R. Gauthier, Fremont, CA (US);

Brian Amick, Austin, TX (US);

Pradeep Trivedi, Sunnyvale, CA (US);

Dean Liu, Sunnyvale, CA (US);

Inventors:

Claude R. Gauthier, Fremont, CA (US);

Brian Amick, Austin, TX (US);

Pradeep Trivedi, Sunnyvale, CA (US);

Dean Liu, Sunnyvale, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An adjustment and calibration system for post-fabrication treatment of a phase locked loop input receiver is provided. The adjustment and calibration system includes at least one adjustment circuit, to which the phase locked loop input receiver is responsive, and a storage device that selectively stores control information (1) associated with a state of the adjustment circuit and/or (2) from a tester that writes such control information to the storage device, where the control information stored in the storage device is subsequently selectively read out in order to adjust the adjustment circuit to a state corresponding to the control information.


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