The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Nov. 15, 2004
Neil J. Goldfine, Newton, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
David C. Grundy, Reading, MA (US);
Volker Weiss, Syracuse, NY (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Neil J. Goldfine, Newton, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
David C. Grundy, Reading, MA (US);
Volker Weiss, Syracuse, NY (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Jentek Sensors, Inc., Waltham, MA (US);
Abstract
Fabrication of samples having material conditions or damage representative of actual components inspected by nondestructive testing involves sensors placed near or mounted on the material surface, such as flexible eddy current sensors or sensor arrays, to monitor the material condition while the sample is being processed. These sample typically have real cracks in or around holes, on curved surfaces, in and under coatings, and on shot peened or otherwise preconditioned surfaces. Processing, such as mechanical or thermal loading to introduce fatigue damage, is stopped once the material condition reaches a predetermined level.