The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Jun. 03, 2004
Tsung-hsi Yang, Yunlin, TW;
Chung-liang Lee, Taipei, TW;
Chu-shou Yang, Taoyuan, TW;
Guangli Luo, Hsinchu, TW;
Wu-ching Chou, Hsinchu, TW;
Chun-yen Chang, Hsinchu, TW;
Tsung-yeh Yang, Yunlin, TW;
Tsung-Hsi Yang, Yunlin, TW;
Chung-Liang Lee, Taipei, TW;
Chu-Shou Yang, Taoyuan, TW;
Guangli Luo, Hsinchu, TW;
Wu-Ching Chou, Hsinchu, TW;
Chun-Yen Chang, Hsinchu, TW;
Tsung-Yeh Yang, Yunlin, TW;
Witty Mate Corporation, Hsi-chih, TW;
Abstract
A technique to grow high quality and large area ZnSe layer on Si substrate is provided, comprising growing GeSi/Ge epitaxial layers on Si substrate by using ultra-high vacuum chemical vapor deposition (UHVCVD), and finally growing a ZnSe film on top Ge buffer layers. Two concepts are applied in the process of this invention, the first one is to block the dislocations generated from GeSiepitaxial layers and to terminate the propagated upward dislocations by using strained interfaces, accordingly the dislocation density of ZnSe layer is greatly reduced and the surface roughness is improved; the second concept is to solve the problems of anti-phase domain due to growth of polar materials on non-polar material using off-cut angle Si substrate, and that is free from diffusion problems between different atoms while generally growing ZnSe layers on Si substrate.