The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2006
Filed:
Nov. 07, 2002
Wilfred M. Bourg, Jr., Melissa, TX (US);
Steven A. Bresnahan, Plano, TX (US);
Gabe Jan Haarsma, Houston, TX (US);
John F. Macgregor, Dundas, CA;
Paul Allan Martin, Celina, TX (US);
Honglu Yu, Hamilton, CA;
Wilfred M. Bourg, Jr., Melissa, TX (US);
Steven A. Bresnahan, Plano, TX (US);
Gabe Jan Haarsma, Houston, TX (US);
John F. MacGregor, Dundas, CA;
Paul Allan Martin, Celina, TX (US);
Honglu Yu, Hamilton, CA;
McMaster University, Hamilton, unknown;
Abstract
A method for extracting feature information from product images using multivariate image analysis based on Principal Component Analysis (PCA) which is used to develop predictive models for feature content and distribution on the imaged product. The imaging system is used to monitor product quality variables in an on-line manufacturing environment. It may also be integrated into a closed-loop feedback control system in automated systems.