The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2006

Filed:

Jan. 31, 2003
Applicants:

Tatsuya Hinoue, Odawara, JP;

Fumitoshi Ito, Hamura, JP;

Shiro Kamohara, Hachioji, JP;

Inventors:

Tatsuya Hinoue, Odawara, JP;

Fumitoshi Ito, Hamura, JP;

Shiro Kamohara, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/119 (2006.01); H01L 31/113 (2006.01);
U.S. Cl.
CPC ...
Abstract

A two-type gate process is suitable for forming a gate insulation film partially formed of a high dielectric film, for example, a titanium oxide film (gate insulation film of the internal circuit) having a relative dielectric constant larger than that of silicon nitride on a substrate, and a silicon nitride film is deposited on the titanium oxide film. The silicon nitride film will prevent oxidation of the titanium oxide film when the surface of the substrate is subjected to thermal oxidation in the next process step. Next, the silicon nitride film and the titanium oxide film on the I/O circuit region are removed, while the silicon nitride film and the titanium oxide film on the internal circuit region remain, and the substrate is subjected to thermal oxidation to form a silicon oxide film as a gate insulation film on the surface of the I/O circuit region.


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