The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2006

Filed:

Feb. 02, 2005
Applicants:

Jin-hua Liu, Yongin-si, KR;

Hee-sung Kang, Sungnam-si, KR;

Choong-ryul Ryou, Suwon-si, KR;

Inventors:

Jin-Hua Liu, Yongin-si, KR;

Hee-Sung Kang, Sungnam-si, KR;

Choong-Ryul Ryou, Suwon-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method of manufacturing a semiconductor device, a device including gate electrodes and asymmetric source and drain regions is formed by employing a semiconductor layer structure. The short channel effect is prevented in the resulting device even though the gate electrodes are of a dimension on the order of nanometers. Additionally, the gate electrodes and asymmetric source and drain regions of the semiconductor device may be precisely formed to have dimensions on the nanometer scale because a semiconductor layer structure is used in the process for manufacturing the semiconductor device.


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