The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Apr. 29, 2004
Masakatsu Suda, Tokyo, JP;
Satoshi Sudou, Tokyo, JP;
Toshiyuki Okayasu, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A data sampling apparatus includes plural stages of first variable delay elements for sequentially delaying a data signal by a first delay amount, plural stages of second variable delay elements for sequentially delaying a strobe signal by a second delay amount which is larger than the first delay amount, and a plurality of timing comparators for sampling a plurality of data signals delayed by the plural stages of first variable delay elements by the strobe signal delayed by the second variable delay element of the same stage, wherein the timing comparator includes a dynamic D-FF circuit for latching and outputting the data signal by its parasitic capacitance based on the strobe signal, a buffer for delaying the strobe signal, and a positive feed-back D-FF circuit for latching and outputting the output signal outputted by the dynamic D-FF circuit by its positive feed-back circuit based on the strobe signal delayed.