The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7032307 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 25, 2006

Filed:

Apr. 13, 2004
Applicants:

Noriaki Matsunaga, Chigasaki, JP;

Hideki Shibata, Yokohama, JP;

Nobuo Hayasaka, Yokosuka, JP;

Inventors:

Noriaki Matsunaga, Chigasaki, JP;

Hideki Shibata, Yokohama, JP;

Nobuo Hayasaka, Yokosuka, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe pin for testing electric characteristics of a semiconductor device comprises a silicon pin core (), and a conductive film () covering the entire surface, including the bottom face, of the pin core. The bottom face of the probe pin is connected directly to an electrode () positioned in or on a print wiring board. A number of probe pins can be connected to the associated electrodes at a high density, thereby forming a fine-pitch probe card having a superior high-frequency signal characteristic.


Find Patent Forward Citations

Quick Actions:

Matsunaga, Noriaki. (2006). Method for fabricating a probe pin for testing electrical characteristics of an apparatus (U.S. Patent No. 7032307). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7032307

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…