The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Dec. 06, 2000
Tadashi Okazaki, Gunma, JP;
Tadashi Okazaki, Gunma, JP;
Advantest Corp., Tokyo, JP;
Abstract
This invention provides a semiconductor memory test system in which the test system will not conduct logic comparison for a particular memory block after a failure is detected in the block. The test system which tests writing and erasing as a unit of block in the memory under test. The test system includes a register provided for each memory under test for holding a first failure generated in a particular block at a first control signal from a pattern generator, establishes a pass result for the particular block for test cycles after the first failure, thereby treating any failure result for the particular block as the pass result thereafter; and resets the register at a cycle specified by a second control signal from the pattern generator to release the pass result.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile