The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Nov. 19, 1999
Jeffery W. Butterbaugh, Eden Prairie, MN (US);
David C. Gray, Sunnyvale, CA (US);
Robert T. Fayfield, St. Louis Park, MN (US);
Kevin Siefering, Chaska, MN (US);
John Heitzinger, St. Louis Park, MN (US);
Fred C. Hiatt, Lakeville, MN (US);
Jeffery W. Butterbaugh, Eden Prairie, MN (US);
David C. Gray, Sunnyvale, CA (US);
Robert T. Fayfield, St. Louis Park, MN (US);
Kevin Siefering, Chaska, MN (US);
John Heitzinger, St. Louis Park, MN (US);
Fred C. Hiatt, Lakeville, MN (US);
FSI International, Inc., Chaska, MN (US);
Abstract
Apparatus and process for conditioning a generally planar substrate, contained in a chamber isolatable from the ambient environment and fed with a conditioning gas which includes reactive gas. The apparatus includes a support for supporting the substrate in the chamber, the substrate being in a lower pressure reaction region of the chamber. A gas inlet is provided for feeding conditioning gas into a gas inlet region of the chamber which is at a higher pressure than the lower pressure reaction region so that the pressure differential causes the conditioning gas to flow toward the surface of the substrate wherein the conditioning gas component will chemically react with and condition the substrate surface, both said higher and lower pressure regions operating in a viscous flow regime. The substrate is supported such that a pressure bias is created across the surface of this substrate so that the gas, after it has chemically reacted with the substrate surface, flows outward from where it has reacted, off the substrate toward the periphery of the chamber and out a peripheral or central underside exhaust outlet. Gas feed may be provided to one or both sides the substrate and light activation of the substrate or conditioning gas may be provided on one or both sides.