The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2006
Filed:
Mar. 01, 2002
Sung-fei Wang, Kaohsiung, TW;
Tsung-ming Pai, Tainan, TW;
Kuang-hui Chen, Kaohsiung, TW;
Advanced Semiconductor Engineering, Inc., Kaoshiung, TW;
Abstract
The present invention relates to a stacked semiconductor chip package comprising a substrate, a first chip, a plate, and a second chip The first chip is mounted on the substrate. The second chip comprises two opposed longitudinal sides defining a first length. The plate is mounted between the first chip and the second chip, and connects the first chip and the second chip. Corresponding to the two longitudinal sides of the second chip, the plate has two opposed longitudinal sides defining a second length. The second length is larger than the first length to expose the opposed longitudinal sides of the plate. An overflow adhesive portion is formed between the plate and the second chip, and the overflow adhesive portion exposes on the plate. Therefore, the testing instrument can detect the size of the overflow adhesive portion and the thickness of the adhesive layer so as to control the quality of the stacked semiconductor chip package. The adhesion strength between the stacked chip and the plate can be augmented to raise the reliability of the stacked semiconductor chip package product.