The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2006

Filed:

Jul. 25, 2002
Applicants:

Chew Hoe Ang, Singapore, SG;

Alan Lek, Singapore, SG;

Wenhe Lin, Singapore, SG;

Inventors:

Chew Hoe Ang, Singapore, SG;

Alan Lek, Singapore, SG;

Wenhe Lin, Singapore, SG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/31 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of forming a silicon nitride-silicon dioxide, composite gate dielectric layer, offering reduced risk of boron penetration from an overlying boron doped polysilicon gate structure, has been developed. A porous, silicon rich silicon nitride layer is first deposited on a semiconductor substrate, allowing a subsequent thermal oxidation procedure to grow a thin silicon dioxide layer on the semiconductor substrate, underlying the porous, silicon rich silicon nitride layer. A two step anneal procedure is then employed with a first step performed in a nitrogen containing ambient to densify the porous, silicon rich silicon nitride layer, while a second step of the anneal procedure, performed in an inert ambient at a high temperature, reduces the foxed charge at the silicon dioxide-semiconductor interface.


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