The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2006
Filed:
Jan. 09, 2004
Yun-yu Wang, Poughquag, NY (US);
Masahiro Kawasaki, Peabody, MA (US);
John Bruley, Poughkeepsie, NY (US);
Anthony G. Domenicucci, New Paltz, NY (US);
Michael A. Gribelyuk, Poughquag, NY (US);
John G. Gaudiello, Poughkeepsie, NY (US);
Yun-Yu Wang, Poughquag, NY (US);
Masahiro Kawasaki, Peabody, MA (US);
John Bruley, Poughkeepsie, NY (US);
Anthony G. Domenicucci, New Paltz, NY (US);
Michael A. Gribelyuk, Poughquag, NY (US);
John G. Gaudiello, Poughkeepsie, NY (US);
Jeol USA, Inc., Peabody, MA (US);
IBM Corporation, Armonk, NY (US);
Abstract
An inline electron holograph method for observing a specimen with a transmission electron microscope having an electron gun, a collimating lens system, two spaced objective lenses, a biprism, and an imaging means comprises the steps of: with the first objective lens forming a virtual image of a portion of the specimen; with the second objective lens focussing the virtual image at an intermediate image plane to form an intermediate image; and projecting the intermediate image onto the imaging means.