The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Aug. 16, 2002
Applicants:

Claude R. Gauthier, Fremont, CA (US);

Brian W. Amick, Austin, TX (US);

Pradeep Trivedi, Sunnyvale, CA (US);

Inventors:

Claude R. Gauthier, Fremont, CA (US);

Brian W. Amick, Austin, TX (US);

Pradeep Trivedi, Sunnyvale, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for post-fabrication calibration and adjustment of a phase locked loop leakage current is provided. The calibration and adjustment system includes an adjustment circuit that adjusts a leakage current offset circuit to compensate for the leakage current of a capacitor. The capacitor connects to a control voltage of the phase locked loop. Such control of the leakage current in the phase locked loop allows a designer to achieve a desired phase locked loop operating characteristic after the phase locked loop has been fabricated. A representative value of the amount of compensation desired in the leakage current may be stored and subsequently read to adjust the phase locked loop.


Find Patent Forward Citations

Loading…