The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2006

Filed:

Mar. 09, 2004
Applicants:

Shih-yi Wen, Hsinchu, TW;

Hsiao-wen Lee, Hsinchu, TW;

Jui-ping Weng, Hsinchu, TW;

Ming-hung Chen, Hsinchu, TW;

Inventors:

Shih-Yi Wen, Hsinchu, TW;

Hsiao-Wen Lee, Hsinchu, TW;

Jui-Ping Weng, Hsinchu, TW;

Ming-Hung Chen, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A MEMS differential actuated nano probe includes four suspension beams arranged in parallel, a connecting base connecting to the suspension beams, a nano probe. Two of the suspension beams elongate due to thermal expansion to allow the deflection of the probe. By heating the suspension beams at different positions, the MEMS differential actuated nano probe can move in two directions with two degrees of freedom. The deflection of the MEMS differential actuated nano probe can be also achieved in piezoelectric or electrostatic way.


Find Patent Forward Citations

Loading…