The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2006

Filed:

Sep. 12, 2000
Applicants:

Debashis Roy Chowdhury, Acton, MA (US);

Pallab Kumar Dasgupta, Andover, MA (US);

Surrendra Amul Dudani, Watertown, MA (US);

Ghassan Khoory, Wellesley, MA (US);

Inventors:

Debashis Roy Chowdhury, Acton, MA (US);

Pallab Kumar Dasgupta, Andover, MA (US);

Surrendra Amul Dudani, Watertown, MA (US);

Ghassan Khoory, Wellesley, MA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique for observability based coverage of a design under test (DUT) is presented. A conventional simulation signal is augmented to include a 'tag value.' In the course of a simulation, assignment statements (for which observability-based coverage is desired) 'inject' tag values on their output signals. A tag value contains an identifier uniquely identifying the assignment statement that produced it. A tag value also contains a “tag history.” The tag history contains copies of the tag values for assignment statements earlier in the flow of control or in the flow of data. If a tag propagated through the DUT appears at an observable output, the circuit designer knows that the assignment statements it identifies have satisfied observability based coverage.


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