The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2006

Filed:

Jan. 30, 2003
Applicants:

Akira Miyata, Kumamoto, JP;

Makio Higashi, Kumamoto, JP;

Shigeki Wada, Kumamoto, JP;

Inventors:

Akira Miyata, Kumamoto, JP;

Makio Higashi, Kumamoto, JP;

Shigeki Wada, Kumamoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03D 5/00 (2006.01); B65H 1/00 (2006.01); B65G 49/07 (2006.01);
U.S. Cl.
CPC ...
Abstract

A resist coating/developing system comprises a cassette station, a process station, and an interface station. A second wafer transfer member for transferring the wafer from a high precision temperature control unit mounted to the interface station to an in-stage of a light exposure device provisionally disposes the wafer held by the second wafer transfer member on a restoration unit in the case where the wafer was taken out from the high precision temperature control unit because it was possible to transfer the wafer onto the in-stage, but it was rendered impossible later to transfer the wafer W onto the in-stage.


Find Patent Forward Citations

Miyata, Akira. (2006). Substrate processing apparatus and substrate transferring method (U.S. Patent No. 6981808). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6981808

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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