The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
Apr. 19, 2001
Joyce S. Oey Hewett, Austin, TX (US);
Anthony J. Toprac, Austin, TX (US);
Christopher A. Bode, Austin, TX (US);
Alexander J. Pasadyn, Austin, TX (US);
Anastasia Oshelski Peterson, Austin, TX (US);
Thomas J. Sonderman, Austin, TX (US);
Michael L. Miller, Cedar Park, TX (US);
Joyce S. Oey Hewett, Austin, TX (US);
Anthony J. Toprac, Austin, TX (US);
Christopher A. Bode, Austin, TX (US);
Alexander J. Pasadyn, Austin, TX (US);
Anastasia Oshelski Peterson, Austin, TX (US);
Thomas J. Sonderman, Austin, TX (US);
Michael L. Miller, Cedar Park, TX (US);
Advanced Micro Devices, Inc., Austin, TX (US);
Abstract
A method for controlling a manufacturing process includes processing a plurality of workpieces in a tool; monitoring a rework rate associated with the workpieces processed in the tool; and initiating an automatic corrective action in response to the rework rate being greater than a predetermined threshold. A manufacturing system includes a tool adapted to process a plurality of workpieces and a rework controller adapted to monitor a rework rate associated with the workpieces processed in the tool and initiate an automatic corrective action in response to the rework rate being greater than a predetermined threshold.