The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2005

Filed:

Apr. 26, 2004
Applicants:

Stephen R. Fox, Hopewell Junction, NY (US);

Neena Garg, Fishkill, NY (US);

Kenneth J. Giewont, Hopewell Junction, NY (US);

Junedong Lee, Hopewell Junction, NY (US);

Devendra K. Sadana, Pleasantville, NY (US);

Inventors:

Stephen R. Fox, Hopewell Junction, NY (US);

Neena Garg, Fishkill, NY (US);

Kenneth J. Giewont, Hopewell Junction, NY (US);

Junedong Lee, Hopewell Junction, NY (US);

Devendra K. Sadana, Pleasantville, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L027/01 ; H01L029/00 ; H01L021/265 ; H01L021/762 ; H01L021/20 ;
U.S. Cl.
CPC ...
Abstract

A method of fabricating a silicon-on-insulator (SOI) having a superficial Si-containing layer that has a reduced number of tile and divot defects is provided. The method includes the steps of: implanting oxygen ions into a surface of a Si-containing substrate, the implanted oxygen ions having a concentration sufficient to form a buried oxide region during a subsequent annealing step; and annealing the substrate containing implanted oxygen ions under conditions wherein the implanted oxygen ions form a buried oxide region which electrically isolates a superficial Si-containing layer from a bottom Si-containing layer. Moreover, the annealing conditions employed are capable of reducing the number of tile or divot defects present in the superficial Si-containing layer so as to allow optical detection of any other defect that has a lower density than the tile or divot defect. The present invention also relates to the SOI substrate that is produced using the inventive method.


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