The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
Nov. 22, 2002
Tadahiro Ohmi, Sendai-shi, Miyagi, JP;
Tomio Uno, Osaka, JP;
Osamu Nakamura, Osaka, JP;
Nobukazu Ikeda, Osaka, JP;
Ryousuke Dohi, Osaka, JP;
Kouji Nishino, Osaka, JP;
Atsushi Matsumoto, Osaka, JP;
Kazuhiko Sugiyama, Minato-ku, JP;
Shujiro Inui, Nishinomiya, JP;
Taiji Sakai, Suita, JP;
Masanori Ueyama, Mino, JP;
Tadahiro Ohmi, Sendai-shi, Miyagi, JP;
Tomio Uno, Osaka, JP;
Osamu Nakamura, Osaka, JP;
Nobukazu Ikeda, Osaka, JP;
Ryousuke Dohi, Osaka, JP;
Kouji Nishino, Osaka, JP;
Atsushi Matsumoto, Osaka, JP;
Kazuhiko Sugiyama, Minato-ku, JP;
Shujiro Inui, Nishinomiya, JP;
Taiji Sakai, Suita, JP;
Masanori Ueyama, Mino, JP;
Abstract
A pressure-type flow rate control apparatus controls the flow rate of fluid passing through an orifice to a target flow rate. The flow rate of a compressible fluid under non-critical conditions (sub-sonic) passing through the orifice is calculated by:() Also provided is an improved pressure-type flow rate control apparatus in which a pressure ratio P/P=r, obtained from an upstream pressure Pand a downstream pressure Pis constantly compared with a critical value r, and under critical conditions (r≦r), the flow rate is calculated by:Qc=KP.Under non-critical conditions (r>r), the flow rate is calculated by Qc=KP(P−P).